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  • Combines non contact measurements with vision system and White Light Interferometer (WLI)
  • Easy alignment and positioning with vision sensor
  • Full QVPAK functionality with vision system
  • Enhanced functionality with WLI-system for high resolution topography evaluation such as surface roughness analysis
qv-wli_z1.eps
Hyper QV WLI 302
Price on application
Hyper QV WLI 302
Price on application
qv-wli_z1.eps
Hyper QV WLI 404
Price on application
Hyper QV WLI 404
Price on application
qv-wli_z1.eps
Hyper QV WLI 606
Price on application
Hyper QV WLI 606
Price on application
*VAT excluded. All products are intended to be sold to commercial customers.